Probe Card is a coined word of "Probe" and "Card".
The probe card is a tool for testing semiconductors used at "Wafer Test" to check quality of IC or LSI in the first process of semiconductor manufacturing. The probe card is expendable.
In the manufacturing process of semiconductors such as IC and LSI, many IC chips are fixed on a wafer, then the wafer is diced and the diced chips are incorporated into packages. Before hundreds of IC chips fixed on a wafer are diced into chips with a few square millimeters, "Wafer Test" is performed to check quality of IC chips.
At wafer test, the needles of the probe make contact with the bonding pads of IC chips or LSI chips fixed on a wafer. After that, the electric characteristics are measured to check quality of IC chips.
The probe card is a crucial tool for testing semiconductors at wafer test.