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Products for Semiconductor Test
Probe Cards
Electron Tube Parts
Filaments for Measures
Precise Processing Such as Tungsten and Molybdenum
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About IR
About Probe Card
About Electron Tube Parts
Products and Technologies

Probe Cards

Cantilever type Probe Card / C type

CE Series

c type
Feature
Standard Cantilever Probe Card
Low Contact force
Stable Contact
High accuracy of alignment
Suitable for variety of Devices

Advanced Probe Card /  V type

VC Series

VC Series
Feature
Vertical contact Probe Card
No limitation by Pad layout
Large probe area (Suitable for 200mm wafer 1-shot)
Small scrub mark
Suitable for High/Low Temperature Test



VS Series

VS Series
Feature
Vertical contact Probe Card with Spring
Suitable for Area array Bump Test



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