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| Cantilever type Probe Card / C ｔｙｐｅ |
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| Feature |
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Standard Cantilever Probe Card |
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Low Contact force |
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Stable Contact |
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High accuracy of alignment |
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Suitable for variety of Devices |
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| Advanced Probe Card / V type |
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| Feature |
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Vertical contact Probe Card |
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No limitation by Pad layout |
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Large probe area (Suitable for 200mm wafer 1-shot) |
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Small scrub mark |
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Suitable for High/Low Temperature Test |
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| Feature |
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Vertical contact Probe Card with Spring |
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Suitable for Area array Bump Test |
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